A New First-Scan Method for Two-Scan Labeling Algorithms

This paper proposes a new first-scan method for two-scan labeling algorithms. In the first scan, our proposed method first scans every fourth image line, and processes the scan line and its two neighbor lines. Then, it processes the remaining lines from top to bottom one by one. Our method decreases the average number of times that must be checked to process a foreground pixel will; thus, the efficiency of labeling can be improved. key words: labeling algorithm, connected component, first scan, pattern recognition